Jason J Ellison received his Masters of Science in Electrical Engineering from Penn State University in December 2017.
He is employed as a signal integrity engineer and develops high-speed interconnects, lab automation technology, and calibration technology. His interests are signal integrity, power integrity and embedded system design. He also writes technical publications for journals such as “The Signal Integrity Journal”.
Mr. Ellison is an active IEEE member and a DesignCon technical program committee member.
Insertion Loss Deviation or Intersymbol Interference Noise?
Insertion loss deviation has been used for about 10 years to quantify channel reflections. Now that COM, ISI noise has been introduced to look at reflection noise, which one is the right one to use?